报告题目:Robust Control for High Speed Atomic Force Microscopyy
报告人:Sajal Kumar Das
报告时间:2017年11月10日 上午9:00—11:00
报告地点:南一楼中311
报告摘要:
This research presents the design of robust control techniques to improve the high speed imaging performance of an atomic force microscope (AFM). The improvement of the performance of the AFM is shown by designing controllers that are able to compensate for unwanted vibration, effect of nonlinearities and cross coupling effect of the AFM. The performance of the proposed controller is compared with the existing built in PI controller of the AFM. The experimental results show that the proposed controller achieves four times better perfomance as compared to PI controller of the AFM.
报告人简介:
Dr. Sajal Kumar Das has received his B.Sc. in Engineering from Rajshahi University of Engineering & Technology (RUET), Bangladesh in the Dept. of Electrical and Electronic Engineering on April 2010. He completed his Doctor of Philosophy (Ph.D.) in Electrical Engineering from University of New South Wales, Australia on 2014 under the supervision of Prof. Ian R. Petersen and A/Prof. Hemanshu R. Pota. In his Ph.D., Dr. Das has worked on the design of robust controllers for improving the performance of Atomic Force Microscopes (AFMs). Dr. Das has proposed new theoretical results on the stability of mixed negative imaginary, passive and small gain systems. The proposed stability results has already been implemented in different applications such as in robust control of hard disk drives.
In May 2014, Dr. Das was appointed as a Research Engineer in National University of Singapore (NUS), Singapore. In January 2015, Dr. Das joined in the Dept. of Electrical and Electronic Engineering of American International University-Bangladesh (AIUB) as an Assistant Professor. He continued his work at AIUB until he joined in the Dept. of Mechatronics Engineering (MTE) of RUET as a Lecturer on 9th September 2015. He is currently working as an Assistant Professor in the department of MTE, RUET. His research interest includes robust control, nanopositioning control, control of mixed passive, negative imaginary and small gain systems, power system control, mechatronics systems control.